Foundations of Measurement, Vol. 2: Geometrical, Threshold and Probabilistic Representations
Patrick Suppes, David H. Krantz, R. Duncan Luce, Amos Tversky
Foundations of Measurement offers the most coherently organized treatment of the topics and issues central to measurement. Much of the research involved has been scattered over several decades and a multitude of journals--available in many instances only to specialties. With the publication of Volumes two and three of this important work, Foundations of Measurement is the most comprehensive presentation in the area of measurement.
Kategorien:
Band:
2
Jahr:
1989
Verlag:
Academic Press
Sprache:
english
Seiten:
458
ISBN 10:
0124254020
ISBN 13:
9780124254022
Datei:
DJVU, 4.97 MB
IPFS:
,
english, 1989